Art

J-GLOBAL ID：201802212147866890   Reference number：18A0780625

Effects of Surface Fluorination on the Dispersion Stability and the Electrical Conductivity of SnO₂ Particles Using Fluorine Gas

フッ素ガスを用いたSnO₂粒子の分散安定性と電気伝導率に及ぼす表面フッ素化の影響

Author (3)： Kim Jae-Ho (Department of Materials Science and Engineering, Faculty of Engineering, University of Fukui) ,  Yonezawa Susumu (Department of Materials Science and Engineering, Faculty of Engineering, University of Fukui) ,  Okada Takashi (Department of Materials Science and Engineering, Faculty of Engineering, University of Fukui)
Material： Chemistry Letters  (Chem Lett)
Volume： 47  Issue： 4  Page： 393-395(J-STAGE)  Publication year： 2018 
JST Material Number： S0742A  ISSN： 0366-7022  CODEN： CMLTAG  Document type： Article
Article type： 短報  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *tin oxide ,  powder ,  *fluorination ,  stability ,  *dispersion ,  *electrical conductivity ,  surface reaction ,  crystal structure ,  surface structure
Semi thesaurus term： F2 fluorination ,  tin dioxide ,  dispersion stability

Author keywords (3)： Surface fluorination ,  SnO₂ particle ,  Electrical conductivity

JST classification (2)： Other noncatalytic reactions  (CB06070U) ,  Electric conduction in crystalline semiconductors  (BM03043X)

Reference (11)：

• 1) V. Brinzari, G. Koroteenkov, V. Golovanov, J. Schwank, V. Lantto, S. Saukko, Thin Solid Films 2002, 408, 51.
• 2) U. R. Chaudhuri, K. Ramkumar, M. Satyam, J. Appl. Phys. 1989, 66, 1748.
• 3) R. Cinnsealach, G. Boschloo, S. N. Rao, D. Fitzmaurice, Sol. Energy Mater. Sol. Cells 1999, 57, 107.
• 4) Y. Xiao, S. Ge, L. Xi, Y. Zho, X. Zhou, B. Zhang, L. Zhang, C. Li, X. Han, Z. Wen, Appl. Surf. Sci. 2008, 254, 7459.
• 5) S. Yu, W. Zhang, L. Li, D. Xu, H. Dong, Y. Jin, Appl. Surf. Sci. 2013, 286, 417.

Terms in the title (4)： フッ素ガス ,  分散安定性 ,  電気伝導率 ,  フッ素化