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J-GLOBAL ID：201802218752876040   Reference number：18A0623956

Novel Method of Evaluating Accurate Thermal Stability for MTJs Using Thermal Disturbance and its Demonstration for Single-/Double-Interface p-MTJ

熱擾乱とその実証単一/二重界面垂直MTJを用いたMTJの評価正確な熱安定性の新しい方法【Powered by NICT】

Author (5)： Saito Takashi (Graduate School of Engineering, Tohoku University, Sendai, Japan) ,  Ito Kenchi (Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan) ,  Honjo Hiroaki (Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan) ,  Ikeda Shoji (Center for Innovative Integrated Electronic Systems, Tohoku University, Sendai, Japan) ,  Endoh Tetsuo (Graduate School of Engineering, Tohoku University, Sendai, Japan)
Material： IEEE Transactions on Magnetics  (IEEE Trans Magn)
Volume： 54  Issue： 4  Page： ROMBUNNO.3400505.1-5  Publication year： 2018 
JST Material Number： A0339B  ISSN： 0018-9464  CODEN： IEMGAQ  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： We propose a novel method to e...

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Thesaurus term： magnetics ,  complementary metal oxide semiconductor ,  temperature dependence ,  *interface(surface) ,  magnesium oxide ,  high temperature ,  *thermal stability
Semi thesaurus term： 材料特性 ,  ReRAM ,  磁気トンネル接合 ,  *熱擾乱 , 【Automatic Indexing@JST】

JST classification (2)： Magnetoelectric devices  (NC03100X) ,  Metal-insulator-metal structures  (BM03087F)

Terms in the title (7)： 熱擾乱 ,  実証 ,  界面 ,  垂直 ,  MTJ ,  評価 ,  熱安定性