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J-GLOBAL ID:201802219509344163   Reference number:18A2235416

In-operando Three-Dimensional Measurement of Quantum State in the Practical Devices Using High-energy X-ray Compton Scattering Spectroscopy

高エネルギーX線コンプトン散乱法による実用デバイス内部における量子状態の反応下3次元分析
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Volume: 61  Issue: 12  Page: 790-796(J-STAGE)  Publication year: 2018 
JST Material Number: G0194B  ISSN: 2433-5835  Document type: Article
Article type: 解説  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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X-ray instruments and techniques 
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