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J-GLOBAL ID:201802227509771639   Reference number:18A0854487

NMR spectrum analysis for CrAs at ambient pressure

周囲圧力におけるCrAsのNMRスペクトル解析【JST・京大機械翻訳】
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Material:
Volume: 536  Page: 810-812  Publication year: 2018 
JST Material Number: H0676B  ISSN: 0921-4526  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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We report NMR spectrum analysi...
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Lattice defects in semiconductors  ,  NMR in general  ,  Luminescence of semiconductors  ,  Electric conduction in semiconductors and insulators in general 
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