J-PARC muon g-2/EDM実験:シリコンストリップ検出器用読み出しASICの性能評価

TSUTSUMI YUKI; TSUTSUMI YUKI; IKEDA HIROKAZU; IKEDA HIROKAZU; IKENO MASAHIRO; IKENO MASAHIRO; ITO TAKUMI; UENO KAZUKI; UENO KAZUKI; UCHIDA TOMOHISA; UCHIDA TOMOHISA; KAWAGOE KIYOTOMO; KISHISHITA TETSUICHI; KISHISHITA TETSUICHI; KUME TATSUYA; KORIKI TAKASHI; KORIKI TAKASHI; SAITO NAOTO; SASAKI OSAMU; SASAKI OSAMU; SATO NOBUHIKO; SATO YUTARO; SATO YUTARO; SHOJI MASAYOSHI; SHOJI MASAYOSHI; SHIRABE SHOHEI; SHIRABE SHOHEI; SUEHARA TAIKAN; SUEHARA TAIKAN; SUE YUKI; SENDAI KOJI; SENDAI KOJI; TAKATOMI TOSHIKAZU; TANAKA MASANOBU; TANAKA MASANOBU; TOJO JUNJI; TOJO JUNJI; NISHIMURA SHOICHIRO; NISHIMURA SHOICHIRO; MATAMA MASATOYO; MATAMA MASATOYO; MIBE TSUTOMU; MIBE TSUTOMU; MURAKAMI TAKESHI; MURAKAMI TAKESHI; YASUDA HIROMASA; YASUDA HIROMASA; YAMANAKA TAKASHI; YAMANAKA TAKASHI; YOSHIOKA TAMAKI; YOSHIOKA TAMAKI

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J-GLOBAL ID：201802247092365427 Reference number：18A0695608

J-PARC muon g-2/EDM実験:シリコンストリップ検出器用読み出しASICの性能評価

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Material：
Volume： 73 Issue： 1 Page： ROMBUNNO.22pK206-3 Publication year： Mar. 23, 2018
JST Material Number： S0671C ISSN： 2189-079X Document type： Proceedings
Article type：短報 Country of issue： Japan (JPN) Language： JAPANESE (JA)

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Electronics for elementary and nuclear physics experiments

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