Art

J-GLOBAL ID：201802249890911243   Reference number：18A0969037

Effects of a GaSb buffer layer on an InGaAs overlayer grown on Ge(111) substrates: Strain, twin generation, and surface roughness

Ge(111)基板上に成長させたInGaAs被覆層に対するGaSbバッファ層の効果:歪,双晶発生,および表面粗さ【JST・京大機械翻訳】

Author (5)： Kajikawa Y. (Department of Electric and Control Systems Engineering, Interdisciplinary Faculty of Science and Engineering, Shimane University, 1060 Nishi-Kawatsu, Matsue 690-8504, Japan) ,  Nishigaichi M. (Department of Electric and Control Systems Engineering, Interdisciplinary Faculty of Science and Engineering, Shimane University, 1060 Nishi-Kawatsu, Matsue 690-8504, Japan) ,  Tenma S. (Department of Electric and Control Systems Engineering, Interdisciplinary Faculty of Science and Engineering, Shimane University, 1060 Nishi-Kawatsu, Matsue 690-8504, Japan) ,  Kato K. (Department of Electric and Control Systems Engineering, Interdisciplinary Faculty of Science and Engineering, Shimane University, 1060 Nishi-Kawatsu, Matsue 690-8504, Japan) ,  Katsube S. (Department of Electric and Control Systems Engineering, Interdisciplinary Faculty of Science and Engineering, Shimane University, 1060 Nishi-Kawatsu, Matsue 690-8504, Japan)
Material： Journal of Applied Physics  (Journal of General Physics and its Application to Other Sciences and to Industry)
Volume： 123  Issue： 16  Page： 161593-161593-7  Publication year： 2018 
JST Material Number： C0266A  ISSN： 0021-8979  CODEN： JAPIAU  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： InGaAs layers were grown by mo...

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Thesaurus term： *buffer layer ,  asymmetry ,  *overlayer ,  MBE growth ,  *indium gallium arsenide ,  symmetry ,  *twin ,  lattice constant ,  *gallium antimonide ,  Crystallography ,  trigonal system ,  domain structure ,  unit cell ,  high resolution X-ray diffraction

JST classification (1)： Semiconductor thin films  (BK14040E)

Terms in the title (9)： Ge ,  成長 ,  InGaAs ,  被覆層 ,  GaSb ,  バッファ層 ,  歪 ,  双晶 ,  表面粗さ