Art

J-GLOBAL ID：201802253480108507   Reference number：18A1472591

Carrier Transport Properties of CdTe Detector under Polarization Condition

偏光条件下でのCdTe検出器のキャリア輸送特性

Author (10)： NAKAGAWA Hisaya (Shizuoka Univ., Shizuoka, JPN) ,  TERAO Tsuyoshi (Shizuoka Univ., Shizuoka, JPN) ,  MASUZAWA Tomoaki (Shizuoka Univ., Shizuoka, JPN) ,  ITO Tetsu (Shizuoka Univ., Shizuoka, JPN) ,  KOIKE Akifumi (Shizuoka Univ., Shizuoka, JPN) ,  KOIKE Akifumi (ANSeeN Inc., Shizuoka, JPN) ,  MORII Hisashi (Shizuoka Univ., Shizuoka, JPN) ,  MORII Hisashi (ANSeeN Inc., Shizuoka, JPN) ,  AOKI Toru (Shizuoka Univ., Shizuoka, JPN) ,  AOKI Toru (ANSeeN Inc., Shizuoka, JPN)
Material： Sensors and Materials  (Sens Mater)
Volume： 30  Issue： 7 (2)  Page： 1605-1610  Publication year： 2018 
JST Material Number： L0338A  ISSN： 0914-4935  CODEN： SENMER  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *polarized light ,  *cadmium telluride ,  *radiation detector ,  band gap ,  *instability ,  polarization (phenomenon) ,  *deep level ,  electrification (static charge) ,  *transport phenomenon ,  *carrier transport ,  wide band gap ,  trapping
Semi thesaurus term： *CdTe ,  trapping ,  charge accumulation

JST classification (2)： Radiation detection and detectors  (AD08020J) ,  Electric conduction in semiconductors and insulators in general  (BM03041P)

Reference (13)：

• M. Niraula A. Nakamura, T. Aoki, Y. Tomita, and Y. Hatanaka: Nucl. Instrum. Methods Phys. Res., Sect. A 491 (2002) 168.
• Y. Eisen and A. Shor: J. Cryst. Growth (1998) 1302.
• C. Scheirber: Nucl. Instrum. Methods Phys. Res., Sect. A 448 (2000) 513.
• H. L. Malm and M. Martini: IEEE Trans. Nucl. Sci. 21 (1974) 322.
• R. O. Bell, G. Entine, and H. B. Serreze: Nucl. Instrum. Methods 117 (1974) 267.

Terms in the title (5)： 偏光 ,  CdTe ,  検出器 ,  キャリア ,  輸送特性