Art
J-GLOBAL ID:201802255513179670   Reference number:18A1340194

Enhancement of Intact Ion Yields in ToF-SIMS Using Molecular Cluster Ion Beams

分子クラスターイオンビームを用いたSIMS分子イオン収率の増加
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Volume: 61  Issue:Page: 452-457(J-STAGE)  Publication year: 2018
JST Material Number: G0194B  ISSN: 2433-5835  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Mass spectrometers  ,  Applications of electron beams and ion beams 
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