Art
J-GLOBAL ID:201802277975112353   Reference number:18A1951902

Electron-irradiated Induced Change of Minority Carrier Lifetime of GaInP/GaAs/Ge Triple-junction Solar Cell

電子照射GaInP/GaAs/Ge三重接合太陽電池の少数寿命の変化【JST・京大機械翻訳】
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Volume: 52  Issue:Page: 1507-1511  Publication year: 2018 
JST Material Number: C2078A  ISSN: 1000-6931  Document type: Article
Article type: 原著論文  Country of issue: China (CHN)  Language: CHINESE (ZH)
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Antigens,antibodies,complements in general  ,  Bioassay  ,  Radioactive wastes 
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