Art
J-GLOBAL ID：201802286853002951
Reference number：18A0949414
Analysis of Organic Materials with SIMS Using New Probe Ions
新しいプローブイオンを用いたSIMSによる有機材料分析
Author (3)：
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Material：
Issue：
OQD-18-022-030 光・量子デバイス研究会
Page：
29-33
Publication year：
Mar. 28, 2018
JST Material Number：
Z0924B
Document type：
Proceedings
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
JAPANESE (JA)
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Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
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,
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JST classification (3)：
JST classification
Category name(code) classified by JST.
Mass spectrometers
, Applications of electron beams and ion beams
, Physical analysis of organic substances in general
Reference (9)：
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S.C.C. Wong, R. Hill, P. Blenkinsopp, N.P. Lockyer, D.E. Weibel, and J.C. Vickerman: ′′Development of a C60+ ion gun for static SIMS and chemical imaging′′, Appl. Surf. Sci. Vol.203-204 p.219 (2003).
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S. Ninomiya, Y. Nakata, Y. Honda, K. Ichiki, T. Seki, T. Aoki, and J. Matsuo: ′′A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions′′, Appl. Surf. Sci. Vol.255 p.1588 (2008).
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A.G. Shard, P.J. Brewer, F.M. Green, and I.S. Gilmore: ′′Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials′′, Surf. Interface Anal. Vol.39 p.294 (2007).
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S. Ninomiya, K. Ichiki, H. Yamada, Y. Nakata, T. Seki, T. Aoki, and J. Matsuo: ′′Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry′′, Appl. Surf. Sci. Vol.43 p.95 (2008).
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藤井麻樹子, 宍戸理恵, 鳥居聡太, 中川駿一郎, 瀬木利夫, 青木学聡, 鈴木茂, 松尾二郎: 「クラスターSIMS法による脂質分子の高感度検出とイメージングへの応用」, 表面科学 Vol.35, No.7 pp.351-355 (2014)
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