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J-GLOBAL ID：201802286908982020   Reference number：18A1353561

Detection of local vibrational modes induced by intrinsic defects in undoped BaSi₂ light absorber layers using Raman spectroscopy

Raman分光法を用いた非ドープBaSi_2光吸収層における固有欠陥により誘起された局所振動モードの検出【JST・京大機械翻訳】

Author (6)： Sato Takuma (Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan) ,  Hoshida Hirofumi (Department of Computer Science and Electronics, Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan) ,  Takabe Ryota (Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan) ,  Toko Kaoru (Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan) ,  Terai Yoshikazu (Department of Computer Science and Electronics, Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan) ,  Suemasu Takashi (Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan)
Material： Journal of Applied Physics  (Journal of General Physics and its Application to Other Sciences and to Industry)
Volume： 124  Issue： 2  Page： 025301-025301-8  Publication year： 2018 
JST Material Number： C0266A  ISSN： 0021-8979  CODEN： JAPIAU  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： We fabricate BaSi₂ ...

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Thesaurus term： Raman spectrum ,  point defect ,  *silicon ,  *Barium ,  *doping ,  interstitial atom ,  *localized vibration ,  MBE growth ,  *Raman spectroscopy ,  wave number ,  deposition rate ,  ab initio calculation ,  Silicon(111) ,  epitaxial film
Semi thesaurus term： *固有欠陥 , 【Automatic Indexing@JST】

JST classification (5)： Lattice defects in semiconductors  (BK12040Q) ,  Semiconductor thin films  (BK14040E) ,  Ferroelectrics,antiferroelectrics and ferroelasticity  (BM05030B) ,  Infrared spectra,Raman scattering and Raman spectra of inorganic compounds  (BM08063C) ,  Infrared spectra,Raman scattering and Raman spectra of semiconductors  (BM08066B)

Terms in the title (6)： Raman分光法 ,  ドープ ,  光吸収層 ,  固有欠陥 ,  誘起 ,  局所振動