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J-GLOBAL ID：201902004317945889   Reference number：19S2664078

Stress singularity parameter approach for evaluating the interfacial reliability of plastic encapsulated LSI devices

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Author (3)：
Hattori, T.

About Hattori, T.

(Mechanical Engineering Research Lab)

About Mechanical Engineering Research Lab

, 
Sakata, S.

About Sakata, S.

(Mechanical Engineering Research Lab)

About Mechanical Engineering Research Lab

, 
Murakami, G.

About Murakami, G.

(Mechanical Engineering Research Lab)

About Mechanical Engineering Research Lab


Material：
Journal of Electronic Packaging, Transactions of the ASME

About Journal of Electronic Packaging, Transactions of the ASME


Volume： 111  Issue： 4  Page： 243-248  Publication year： 1989 
JST Material Number： SCOPUS  ISSN： 1043-7398  CODEN： JEPAE 
Terms in the title (1)：
Terms in the title
Keywords automatically extracted from the title.
LSI

About LSI


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