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J-GLOBAL ID：201902007695968799   Reference number：19S3050857

An Empirical Model for Device Degradation Due to Hot-Carrier Injection

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Author (2)：
Takeda, E.

About Takeda, E.

(Central Research Laboratory, Hitachi Ltd.)

About Central Research Laboratory, Hitachi Ltd.

, 
Suzuki, N.

About Suzuki, N.

(Musashi Works, Hitachi Ltd.)

About Musashi Works, Hitachi Ltd.


Material：
IEEE Electron Device Letters

About IEEE Electron Device Letters


Volume： 4  Issue： 4  Page： 111-113  Publication year： 1983 
JST Material Number： SCOPUS  ISSN： 0741-3106 
Language： English (EN)

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