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J-GLOBAL ID：201902008528200125   Reference number：19S2482630

Comparison of minority carrier lifetimes measured by photoconductive decay and ac photovoltaic method

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Author (4)：
Honma, Noriaki

About Honma, Noriaki

(Central Research Laboratory, Hitachi Ltd)

About Central Research Laboratory, Hitachi Ltd

, 
Munakata, Chusuke

About Munakata, Chusuke

(Central Research Laboratory, Hitachi Ltd)

About Central Research Laboratory, Hitachi Ltd

, 
Shimizu, Hirofumi

About Shimizu, Hirofumi

(Central Research Laboratory, Hitachi Ltd)

About Central Research Laboratory, Hitachi Ltd

, 
Shimizu, Hirofumi

About Shimizu, Hirofumi

(Kofu Branch, Musashi Works Hitachi Ltd)

About Kofu Branch, Musashi Works Hitachi Ltd


Material：
Japanese Journal of Applied Physics

About Japanese Journal of Applied Physics


Volume： 27  Issue： 8 R  Page： L1498-L1503  Publication year： 1988 
JST Material Number： SCOPUS  ISSN： 0021-4922 
Language： English (EN)
Terms in the title (1)：
Terms in the title
Keywords automatically extracted from the title.
Ac

About Ac


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