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J-GLOBAL ID：201902016262762974   Reference number：19S3067137

Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction

Author (4)： Takayanagi, Kunio (Physics Department, Tokyo Institute of Technology) ,  Tanishiro, Yasumasa (Physics Department, Tokyo Institute of Technology) ,  Takahashi, Shigeki (Physics Department, Tokyo Institute of Technology) ,  Takahashi, Masaetsu (Physics Department, Tokyo Institute of Technology)
Material： Surface Science
Volume： 164  Issue： 2-3  Page： 367-392  Publication year： 1985 
JST Material Number： SCOPUS  ISSN： 0039-6028  CODEN： SUSCA 
Language： English (EN)

Terms in the title (1)： Si