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J-GLOBAL ID：201902100696313214   Reference number：19S2206893

Test generation for sequential circuits using state transition diagram and test generation for combinatorial circuit part

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Author (4)：
Hasegawa, Tetsu

About Hasegawa, Tetsu

(Faculty of Engineering, Chiba University)

About Faculty of Engineering, Chiba University

, 
Miura, Kyoko

About Miura, Kyoko

(Faculty of Engineering, Chiba University)

About Faculty of Engineering, Chiba University

, 
Ohmameuda, Toshiaki

About Ohmameuda, Toshiaki

(Faculty of Engineering, Chiba University)

About Faculty of Engineering, Chiba University

, 
Ito, Hideo

About Ito, Hideo

(Faculty of Engineering, Chiba University)

About Faculty of Engineering, Chiba University


Material：
Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)

About Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)


Volume： 84  Issue： 8  Page： 20-27  Publication year： 2001 
JST Material Number： SCOPUS  ISSN： 8756-663X  CODEN： ECJEE 
Country of issue： United States (USA)  Language： English (EN)

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