Art
J-GLOBAL ID：201902113396344139   Reference number：19S2509602

Carrier lifetime measurements by microwave photoconductive decay method at low injection levels

  • Publisher site Copy service
  • Access JDreamⅢ for advanced search and analysis.
Author (5)：
Fujihira, Chiyo

About Fujihira, Chiyo

(Leo Corporation)

About Leo Corporation

, 
Fujihira, Chiyo

About Fujihira, Chiyo

(Research Center for Integrated Systems, Hiroshima University)

About Research Center for Integrated Systems, Hiroshima University

, 
Fujihira, Chiyo

About Fujihira, Chiyo

(Air Liquide Laboratories, Hiroshima University)

About Air Liquide Laboratories, Hiroshima University

, 
Hidehisa, Hashizume

About Hidehisa, Hashizume

(Leo Corporation)

About Leo Corporation

, 
Hidehisa, Hashizume

About Hidehisa, Hashizume

(Research Center for Integrated Systems, Hiroshima University)

About Research Center for Integrated Systems, Hiroshima University


Material：
Japanese Journal of Applied Physics

About Japanese Journal of Applied Physics


Volume： 32  Issue： 9  Page： L1362-L1364  Publication year： 1993 
JST Material Number： SCOPUS  ISSN： 0021-4922 
Language： English (EN)

Return to Previous Page

TOP

BOTTOM