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J-GLOBAL ID：201902115993209016   Reference number：19S2366914

Experimental Results and Modeling Techniques for Substrate Noise in Mixed-Signal Integrated Circuits

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Author (4)：
Su, David K.

About Su, David K.

(Center for Integrated Systems, Stanford University)

About Center for Integrated Systems, Stanford University

, 
Loinaz, Marc J.

About Loinaz, Marc J.

(Center for Integrated Systems, Stanford University)

About Center for Integrated Systems, Stanford University

, 
Wooley, Bruce A.

About Wooley, Bruce A.

(Center for Integrated Systems, Stanford University)

About Center for Integrated Systems, Stanford University

, 
Masui, Shoichi

About Masui, Shoichi

(Semiconductor Basic Technology Research Laboratory, Nippon Steel Corporation)

About Semiconductor Basic Technology Research Laboratory, Nippon Steel Corporation


Material：
IEEE Journal of Solid-State Circuits

About IEEE Journal of Solid-State Circuits


Volume： 28  Issue： 4  Page： 420-430  Publication year： 1993 
JST Material Number： SCOPUS  ISSN： 0018-9200 
Language： English (EN)

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