Art
J-GLOBAL ID：201902200161232767   Reference number：19S1069157

Fault diagnosis for physical defects of unknown behaviors

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Author (4)：
Wen, X.

About Wen, X.

(SynTest Technologies, Inc.)

About SynTest Technologies, Inc.

, 
Tamamoto, H.

About Tamamoto, H.

(Dept. of Information Engr., Akita University)

About Dept. of Information Engr., Akita University

, 
Saluja, K. K.

About Saluja, K. K.

(Dept. of ECE, University of Wisconsin)

About Dept. of ECE, University of Wisconsin

, 
Kinoshita, K.

About Kinoshita, K.

(Faculty of Informatics, Osaka Gakuin University)

About Faculty of Informatics, Osaka Gakuin University


Material：
Proceedings of the Asian Test Symposium

About Proceedings of the Asian Test Symposium


Volume： 2003-January  Page： 236-241  Publication year： 2003 
JST Material Number： SCOPUS  ISSN： 1081-7735  ISBN： 0769519512 
Country of issue： United States (USA)  Language： English (EN)

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