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J-GLOBAL ID：201902200816429410   Reference number：19S0442926

Visualizing patterned thin films by grazing-incidence small-angle X-ray scattering coupled with computed tomography

Author (10)： Ogawa, Hiroki (Institute for Chemical Research, Kyoto University) ,  Ogawa, Hiroki (Japan Synchrotron Radiation Research Institute) ,  Kanaya, Toshiji (Institute for Chemical Research, Kyoto University) ,  Fujiwara, Akihiko (Japan Synchrotron Radiation Research Institute) ,  Takata, Masaki (Japan Synchrotron Radiation Research Institute) ,  Takata, Masaki (Riken SPring-8 Center) ,  Nishikawa, Yukihiro (Faculty of Materials Science and Engineering, Kyoto Institute of Technology) ,  Takenaka, Mikihito (Department of Polymer Chemistry, Graduate School of Engineering, Kyoto University) ,  Takenaka, Mikihito (Riken SPring-8 Center) ,  Wang, Yi-Chin (Department of Polymer Chemistry, Graduate School of Engineering, Kyoto University)
Material： Journal of Applied Crystallography
Volume： 48  Page： 1645-1650  Publication year： 2015 
JST Material Number： SCOPUS  ISSN： 0021-8898  CODEN： JACGA 
Country of issue： United Kingdom (GBR)  Language： English (EN)