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J-GLOBAL ID：201902201193228180   Reference number：19S0026554

Stigmatic imaging mass spectrometry using a multi-turn time-of-flight mass spectrometer

Author (20)： Hazama, Hisanao (Graduate School of Engineering, Osaka University) ,  Hazama, Hisanao (Japan Science and Technology Agency, CREST) ,  Nagao, Hirofumi (Graduate School of Engineering, Osaka University) ,  Nagao, Hirofumi (Japan Science and Technology Agency, CREST) ,  Yoshimura, Hidetoshi (Graduate School of Engineering, Osaka University) ,  Yoshimura, Hidetoshi (Japan Science and Technology Agency, CREST) ,  Awazu, Kunio (Graduate School of Engineering, Osaka University) ,  Awazu, Kunio (Graduate School for the Creation of New Photonics Industries) ,  Awazu, Kunio (Japan Science and Technology Agency, CREST) ,  Aoki, Jun (Graduate School of Science, Osaka University) ,  Aoki, Jun (Japan Science and Technology Agency, CREST) ,  Toyoda, Michisato (Graduate School of Science, Osaka University) ,  Toyoda, Michisato (Japan Science and Technology Agency, CREST) ,  Naito, Yasuhide (Graduate School for the Creation of New Photonics Industries) ,  Naito, Yasuhide (Japan Science and Technology Agency, CREST) ,  Masuda, Katsuyoshi (Suntory Institute for Bioorganic Research) ,  Masuda, Katsuyoshi (Japan Science and Technology Agency, CREST) ,  Fujii, Kenichi (Faculty of Information Science and Technology, Osaka Institute of Technology) ,  Fujii, Kenichi (Japan Science and Technology Agency, CREST) ,  Tashima, Toshio (Japan Science and Technology Agency, CREST)
Material： Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest
Publication year： 2009 
JST Material Number： SCOPUS  ISBN： 9781424438303 
Country of issue： United States (USA)  Language： English (EN)