Art
J-GLOBAL ID：201902206365932405   Reference number：19S0703642

Reasonable circuit analysis considering comprehensively reliability and variability

  • Publisher site Copy service
  • Access JDreamⅢ for advanced search and analysis.
Author (4)：
Kurokawa, Atsushi

About Kurokawa, Atsushi

(Graduate School of Science and Technology, Hirosaki University)

About Graduate School of Science and Technology, Hirosaki University

, 
Watanabe, Masayuki

About Watanabe, Masayuki

(Graduate School of Science and Technology, Hirosaki University)

About Graduate School of Science and Technology, Hirosaki University

, 
Hoshi, Makoto

About Hoshi, Makoto

(Graduate School of Science and Technology, Hirosaki University)

About Graduate School of Science and Technology, Hirosaki University

, 
Fukase, Masa-Aki

About Fukase, Masa-Aki

(Graduate School of Science and Technology, Hirosaki University)

About Graduate School of Science and Technology, Hirosaki University


Material：
13th International Symposium on Communications and Information Technologies: Communication and Information Technology for New Life Style Beyond the Cloud, ISCIT 2013

About 13th International Symposium on Communications and Information Technologies: Communication and Information Technology for New Life Style Beyond the Cloud, ISCIT 2013


Page： 282-287  Publication year： 2013 
JST Material Number： SCOPUS  ISBN： 9781467355803 
Country of issue： United States (USA)  Language： English (EN)

Return to Previous Page

TOP

BOTTOM