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J-GLOBAL ID:201902206493728390   Reference number:19S0367853

X-ray Fresnel diffractometry for ultralow emittance diagnostics of next generation synchrotron light sources

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Volume: 18  Issue:Publication year: 2015 
JST Material Number: SCOPUS  ISSN: 1098-4402 
Country of issue: United States (USA)  Language: English (EN)
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