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J-GLOBAL ID：201902209506445790   Reference number：19S1350970

Sparse modeling of EELS and EDX spectral imaging data by nonnegative matrix factorization

Author (9)： Shiga, Motoki (Department of Electrical, Electronic and Computer Engineering, Gifu University) ,  Tatsumi, Kazuyoshi (Advanced Measurement Technology Center, Institute of Materials and Systems for Sustainability, Nagoya University) ,  Muto, Shunsuke (Advanced Measurement Technology Center, Institute of Materials and Systems for Sustainability, Nagoya University) ,  Tsuda, Koji (Graduate School of Frontier Sciences, University of Tokyo) ,  Tsuda, Koji (Center for Materials Research by Information Integration, National Institute for Materials Science) ,  Tsuda, Koji (Biotechnology Research Institute for Drug Discovery, National Institute of Advanced Industrial Science and Technology) ,  Yamamoto, Yuta (High-Voltage Electron Microscope Laboratory, Institute of Materials and Systems for Sustainability, Nagoya University) ,  Mori, Toshiyuki (Environment and Energy Materials Division, National Institute for Materials Science) ,  Tanji, Takayoshi (Division of Materials Research, Institute of Materials and Systems for Sustainability, Nagoya University)
Material： Ultramicroscopy
Volume： 170  Page： 43-59  Publication year： 2016 
JST Material Number： SCOPUS  ISSN： 0304-3991  CODEN： ULTRD 
Country of issue： Netherlands (NLD)  Language： English (EN)

Terms in the title (2)： EELS ,  EDX