Art
J-GLOBAL ID：201902209728771890   Reference number：19S0550562

Frequency analysis of transient electromagnetic wave caused by low voltage ESD in spherical electrode

  • Publisher site Copy service
  • Access JDreamⅢ for advanced search and analysis.
Author (3)：
Kawamata, Ken

About Kawamata, Ken

(Dept. of Electronic Engineering, Tohoku Gakuin University)

About Dept. of Electronic Engineering, Tohoku Gakuin University

, 
Minegishi, Shigeki

About Minegishi, Shigeki

(Dept. of Electrical Engineering and Information Technology, Tohoku Gakuin University)

About Dept. of Electrical Engineering and Information Technology, Tohoku Gakuin University

, 
Fujiwara, Osamu

About Fujiwara, Osamu

(Nagoya Institute of Technology)

About Nagoya Institute of Technology


Material：
IEEE International Symposium on Electromagnetic Compatibility

About IEEE International Symposium on Electromagnetic Compatibility


Volume： 2014-December  Page： 605-608  Publication year： 2014 
JST Material Number： SCOPUS  ISSN： 1077-4076  ISBN： 9784885522871  CODEN： IISPD 
Country of issue： United States (USA)  Language： English (EN)
Terms in the title (2)：
Terms in the title
Keywords automatically extracted from the title.
WAVE

About WAVE

, 
ESD

About ESD


Return to Previous Page

TOP

BOTTOM