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J-GLOBAL ID：201902211752307040   Reference number：19S0474938

A low capture power test generation method using capture safe test vectors

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Author (4)：
Hirai, Atsushi

About Hirai, Atsushi

(Graduate School of Industrial Technology, Nihon University)

About Graduate School of Industrial Technology, Nihon University

, 
Yamauchi, Yukari

About Yamauchi, Yukari

(College of Industrial Technology, Nihon University)

About College of Industrial Technology, Nihon University

, 
Hosokawa, Toshinori

About Hosokawa, Toshinori

(College of Industrial Technology, Nihon University)

About College of Industrial Technology, Nihon University

, 
Arai, Masayuki

About Arai, Masayuki

(College of Industrial Technology, Nihon University)

About College of Industrial Technology, Nihon University


Material：
Proceedings - 2015 20th IEEE European Test Symposium, ETS 2014

About Proceedings - 2015 20th IEEE European Test Symposium, ETS 2014


Publication year： 2015 
JST Material Number： SCOPUS  ISBN： 9781479976034 
Country of issue： United States (USA)  Language： English (EN)

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