About Tanamoto T.
About Corporate R&D Center, Toshiba Corporation, Saiwai-ku, Kawasaki 212-8582, Japan
About Nishi Y.
About Corporate R&D Center, Toshiba Corporation, Saiwai-ku, Kawasaki 212-8582, Japan
About Ono K.
About Advanced Device Laboratory, RIKEN, Wako-shi, Saitama 351-0198, Japan
About Applied Physics Letters
Please login to MyJ-GLOBAL to see full information. You also need to select "Display abstract, etc. of medical articles" in your MyJ-GLOBAL account page in order to see abstracts, etc. of medical articles.
About characterization
About resonance tunnel effect
About low temperature
About silicon
About discontinuity
About image
About transistor
About fingerprint
About current-voltage characteristic
About ゲート長
About ナノエレクトロニクス
About 単一電子
About 認識アルゴリズム
About Transistors
About 画像認識
About アルゴリズム
About 指紋
About 電子効果
About 応用