Art
J-GLOBAL ID:201902212790822249   Reference number:19S1951961

Characteristics of CVD silicon oxide films: Effect of discharge form on formation and properties of films

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Volume: 33  Issue:Page: 106-116  Publication year: 2004 
JST Material Number: SCOPUS  ISSN: 1099-2871  CODEN: HTARF 
Country of issue: United States (USA)  Language: English (EN)
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