Art
J-GLOBAL ID：201902213821223418   Reference number：19S0593115

Pin open detection of BGA IC by supply current testing

  • Publisher site Copy service
  • Access JDreamⅢ for advanced search and analysis.
Author (3)：
Ono, Akira

About Ono, Akira

(Kagawa National College of Technology)

About Kagawa National College of Technology

, 
Yotsuyanagi, Hiroyuki

About Yotsuyanagi, Hiroyuki

(Institute of Technology and Science, University of Tokushima)

About Institute of Technology and Science, University of Tokushima

, 
Hashizume, Masaki

About Hashizume, Masaki

(Institute of Technology and Science, University of Tokushima)

About Institute of Technology and Science, University of Tokushima


Material：
2014 International Conference on Electronics Packaging, ICEP 2014

About 2014 International Conference on Electronics Packaging, ICEP 2014


Page： 231-234  Publication year： 2014 
JST Material Number： SCOPUS  ISBN： 9784904090107 
Country of issue： United States (USA)  Language： English (EN)
Terms in the title (2)：
Terms in the title
Keywords automatically extracted from the title.
BGA

About BGA

, 
IC

About IC


Return to Previous Page

TOP

BOTTOM