Art

J-GLOBAL ID：201902218847185598   Reference number：19A2900159

Influence of the terrace width of pentacene underlayers on the crystallinity of C₆₀ overlayers

C_60被覆層の結晶度に及ぼすペンタセン下層のテラス幅の影響【JST・京大機械翻訳】

Author (4)： Nakata Keiichi (Graduate School of Science and Technology, Hirosaki University, 3 Bunkyo-cho, Hirosaki-shi, Aomori 036-8561, Japan) ,  Nakazawa Hideki (Graduate School of Science and Technology, Hirosaki University, 3 Bunkyo-cho, Hirosaki-shi, Aomori 036-8561, Japan) ,  Okamoto Hiroshi (Graduate School of Science and Technology, Hirosaki University, 3 Bunkyo-cho, Hirosaki-shi, Aomori 036-8561, Japan) ,  Kobayashi Yasuyuki (Graduate School of Science and Technology, Hirosaki University, 3 Bunkyo-cho, Hirosaki-shi, Aomori 036-8561, Japan)
Material： Thin Solid Films
Volume： 692  Page： Null  Publication year： 2019 
JST Material Number： B0899A  ISSN： 0040-6090  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Abstract/Point： Pentacene and fullerene (C<sub...

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Thesaurus term： X-Ray Diffraction ,  atomic force microscope ,  fullerene ,  quality ,  substrate temperature ,  overlayer ,  *lower layer ,  *crystallinity ,  crystal grain size (diameter) ,  thin film growth ,  organic semiconductor ,  hetero-structure ,  organic solar cell ,  *terrace ,  polyacene

Author keywords (8)： Organic semiconductor ,  Pentacene ,  Fullerene ,  Stacked heterostructure ,  Terrace ,  Crystallinity ,  Atomic force microscopy ,  X-ray diffraction

JST classification (2)： Thin films of organic compounds  (BK14070L) ,  Transistors  (NC03070N)

Substance index (1)： Pentacene

Terms in the title (5)： 被覆層 ,  結晶度 ,  ペンタセン ,  下層 ,  テラス