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J-GLOBAL ID：201902219365138452   Reference number：19S0498282

Optical characterization by variable angle spectroscopic ellipsometry of nitrogen-doped MgxZn1 - XO thin films prepared by the plasma-assisted reactive evaporation method

Author (16)： Abe, Takami (Iwate University) ,  Nakagawa, Akira (Iwate University) ,  Nakagawa, Michiko (Iwate University) ,  Chiba, Tetsuya (Iwate University) ,  Takahashi, Shuzo (Iwate University) ,  Chiba, Shigeki (Iwate University) ,  Ojima, Tsutomu (Iwate University) ,  Aota, Katsumi (Iwate University) ,  Daibo, Masahiro (Iwate University) ,  Osada, Hiroshi (Iwate University) ,  Fujiwara, Tamiya (Iwate University) ,  Niikura, Ikuo (Iwate University) ,  Kashiwaba, Yasube (Iwate University) ,  Kashiwaba, Yasuhiro (Sendai National College of Technology) ,  Tsutsumi, Kouichi (J.A. Woollam Japan Corporation) ,  Suzuki, Michio (J.A. Woollam Japan Corporation)
Material： Thin Solid Films
Volume： 571  Issue： P3  Page： 615-619  Publication year： 2014 
JST Material Number： SCOPUS  ISSN： 0040-6090  CODEN： THSFA 
Country of issue： Netherlands (NLD)  Language： English (EN)