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J-GLOBAL ID：201902219404165144   Reference number：19S1439205

Study on Device Matrix Array structure for MOSFET gm variability evaluation

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Author (6)：
Terada, Kazuo

About Terada, Kazuo

(Faculty of Information Sciences, Hiroshima City University)

About Faculty of Information Sciences, Hiroshima City University

, 
Takeda, Ryo

About Takeda, Ryo

(Faculty of Information Sciences, Hiroshima City University)

About Faculty of Information Sciences, Hiroshima City University

, 
Tsuji, Katsuhiro

About Tsuji, Katsuhiro

(Faculty of Information Sciences, Hiroshima City University)

About Faculty of Information Sciences, Hiroshima City University

, 
Tsunomura, Takaaki

About Tsunomura, Takaaki

(MIRAI-Selete)

About MIRAI-Selete

, 
Nishida, Akio

About Nishida, Akio

(MIRAI-Selete)

About MIRAI-Selete

, 
Mogami, Tohru

About Mogami, Tohru

(MIRAI-Selete)

About MIRAI-Selete


Material：
IEEE International Conference on Microelectronic Test Structures

About IEEE International Conference on Microelectronic Test Structures


Page： 73-76  Publication year： 2012 
JST Material Number： SCOPUS  ISBN： 9781467310284  CODEN： PIMTE 
Country of issue： United States (USA)  Language： English (EN)
Terms in the title (1)：
Terms in the title
Keywords automatically extracted from the title.
MOSFET

About MOSFET


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