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J-GLOBAL ID：201902221048619252   Reference number：19A0128888

Evaluation of the temperature dependence of the cesium deposition on the plasma grid in the JT-60SA negative ion source

JT-60SA負イオン源におけるプラズマグリッドへのセシウム堆積の温度依存性の評価【JST・京大機械翻訳】

Author (7)： Yoshida M. (Department of Electrical, Electronic, and Information Engineering, Yamaguchi University, Ube 755-8611, Japan) ,  Oohara W. (Department of Electrical, Electronic, and Information Engineering, Yamaguchi University, Ube 755-8611, Japan) ,  Ichikawa M. (National Institutes for Quantum and Radiological Science and Technology, 801-1, Mukouyama, Naka 311-0193, Japan) ,  Hiratsuka J. (National Institutes for Quantum and Radiological Science and Technology, 801-1, Mukouyama, Naka 311-0193, Japan) ,  Umeda N. (National Institutes for Quantum and Radiological Science and Technology, 801-1, Mukouyama, Naka 311-0193, Japan) ,  Kojima A. (National Institutes for Quantum and Radiological Science and Technology, 801-1, Mukouyama, Naka 311-0193, Japan) ,  Kashiwagi M. (National Institutes for Quantum and Radiological Science and Technology, 801-1, Mukouyama, Naka 311-0193, Japan)
Material： AIP Conference Proceedings  (AIP Conf Proc)
Volume： 2052  Issue： 1  Page： 040008-040008-9  Publication year： 2018 
JST Material Number： D0071C  ISSN： 0094-243X  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： In order to evaluate depositio...

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Thesaurus term： *negative ion source ,  detector ,  ion current ,  surface ionization ,  monomolecular layer ,  pulse ,  *plasma ,  *Cesium ,  modeling ,  *temperature dependence ,  Adsorption ,  desorption ,  chamber ,  quartz crystal microbalance ,  temperature range

JST classification (2)： Fusion devices  (BJ02083Z) ,  Plasma devices  (BJ02082I)

Terms in the title (8)： JT-60SA ,  負イオン源 ,  プラズマ ,  グリッド ,  セシウム ,  堆積 ,  温度依存性 ,  評価