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J-GLOBAL ID：201902221247229863   Reference number：19S0441672

An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology

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Author (6)：
Igarashi, Mitsuhiko

About Igarashi, Mitsuhiko

(Renesas Electronics Corporation)

About Renesas Electronics Corporation

, 
Takeuchi, Kan

About Takeuchi, Kan

(Renesas Electronics Corporation)

About Renesas Electronics Corporation

, 
Okagaki, Takeshi

About Okagaki, Takeshi

(Renesas Electronics Corporation)

About Renesas Electronics Corporation

, 
Shibutani, Koji

About Shibutani, Koji

(Renesas Electronics Corporation)

About Renesas Electronics Corporation

, 
Matsushita, Hiroaki

About Matsushita, Hiroaki

(Renesas Electronics Corporation)

About Renesas Electronics Corporation

, 
Nii, Koji

About Nii, Koji

(Renesas Electronics Corporation)

About Renesas Electronics Corporation


Material：
European Solid-State Circuits Conference

About European Solid-State Circuits Conference


Volume： 2015-October  Page： 112-115  Publication year： 2015 
JST Material Number： SCOPUS  ISSN： 1930-8833  ISBN： 9781467374705 
Country of issue： United States (USA)  Language： English (EN)
Terms in the title (2)：
Terms in the title
Keywords automatically extracted from the title.
HCI

About HCI

, 
CMOS

About CMOS


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