Art

J-GLOBAL ID：201902227004651301   Reference number：19A0098704

Fast Phase Retrieval from Reflection High Energy Electron Diffraction Intensities during Growth

成長中の反射高エネルギー電子回折強度からの高速位相回復

Author (1)： Kawamura Takaaki (Surface and Vacuum Physics, Institute of Industrial Science, University of Tokyo)
Material： e-Journal of Surface Science and Nanotechnology (Web)  (表面科学とナノテクノロジー)
Volume： 16  Page： 97-100(J-STAGE)  Publication year： 2018 
JST Material Number： U0016A  ISSN： 1348-0391  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *RHEED ,  strength ,  *phase restoration ,  tracking ,  *real time processing ,  automatic monitoring ,  algorithm ,  machining time ,  grazing incidence ,  sequential detection ,  successive approximation ,  reproducibility ,  morphology ,  surface structure ,  *MBE growth
Semi thesaurus term： hybrid algorithm ,  real time monitoring ,  diffraction intensity ,  real-time tracking ,  processing time ,  reflection high energy electron diffraction ,  surface morphology

Author keywords (5)： RHEED ,  Phase retrieval ,  Surface morphology ,  MBE growth ,  Real time observation

JST classification (2)： Techniques and equipment of crystal growth  (BK13020B) ,  Electron diffraction methods  (BK01030T)

Reference (11)：

• [1] J. H. Neave, B. A. Joyce, P. J. Dobson, and N. Norton, Appl. Phys. A 31, 1 (1983). https://doi.org/10.1007/BF00617180
• [2] C. S. Lent and P. I. Cohen, Surf. Sci. 139, 121 (1984). https://doi.org/10.1016/0039-6028(84)90013-X
• [3] T. Kawamura, P. A. Maksym, and T. Iijima, Surf. Sci. 148, L671 (1984). https://doi.org/10.1016/0039-6028(84)90574-0
• [4] T. Kawamura and P. A. Maksym, Surf. Sci. 161, 12 (1985). https://doi.org/10.1016/0039-6028(85)90724-1
• [5] T. Kawamura, Surf. Sci. 351, 129 (1996). https://doi.org/10.1016/0039-6028(95)01262-1

Terms in the title (3)： 成長 ,  反射高エネルギー電子回折 ,  位相回復