Art
J-GLOBAL ID:201902227935801575   Reference number:19A0186863

Finding All Solutions of Piecewise-Linear Resistive Circuits Using Triangular LP Test

三角LPテストを用いた区分線形抵抗回路のすべての解の発見【JST・京大機械翻訳】
Author (2):
Material:
Volume: 2018  Issue: APCCAS  Page: 243-246  Publication year: 2018 
JST Material Number: W2441A  Document type: Proceedings
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
Abstract/Point:
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Japanese summary of the article(about several hundred characters).
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An efficient algorithm is prop...
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
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JST classification
Category name(code) classified by JST.
Graphic and image processing in general 

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