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J-GLOBAL ID：201902236174870600   Reference number：19A2517703

Local melting of Au/Ni thin films irradiated by femtosecond laser through GaN

GaNを通してフェムト秒レーザで照射したAu/Ni薄膜の局所融解【JST・京大機械翻訳】

Author (7)： Okada Tatsuya (Division of Science and Technology, Tokushima University, Tokushima, Japan) ,  Tomita Takuro (Division of Science and Technology, Tokushima University, Tokushima, Japan) ,  Katayama Hiroyuki (Graduate School of Advanced Technology and Science, Tokushima University, Tokushima, Japan) ,  Fuchikami Yuki (Graduate School of Advanced Technology and Science, Tokushima University, Tokushima, Japan) ,  Ueki Tomoyuki (Division of Science and Technology, Tokushima University, Tokushima, Japan) ,  Hisazawa Hiromu (Division of Science and Technology, Tokushima University, Tokushima, Japan) ,  Tanaka Yasuhiro (Faculty of Engineering and Design, Kagawa University, Takamatsu, Japan)
Material： Applied Physics. A. Materials Science & Processing  (Applied Physics. A. Solids and Surfaces)
Volume： 125  Issue： 10  Page： 1-6  Publication year： 2019 
JST Material Number： D0256C  ISSN： 0947-8396  CODEN： APHYCC  Document type： Article
Article type： 短報  Country of issue： Germany, Federal Republic of (DEU)  Language： ENGLISH (EN)

Abstract/Point： We found appropriate femtoseco...

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Thesaurus term： laser irradiation ,  *thin film ,  transmission electron microscope ,  laser damage ,  *laser ,  *gallium nitride ,  *femtosecond laser ,  *Gold ,  vapor deposition ,  freezing and solidification ,  electron microscopy ,  solid solution ,  laser pulse ,  *Nickel ,  bilayer ,  bilayer

JST classification (2)： Laser irradiation effects and damages  (BK16040S) ,  Manufacturing technology of solid-state devices  (NC03030V)

Terms in the title (6)： GaN ,  フェムト秒レーザ ,  Au ,  Ni ,  薄膜 ,  融解