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J-GLOBAL ID:201902236710239714   Reference number:19A1997989

Radial Profile Measurements of Electron Temperature and Density Using the Thomson Scattering System in GAMMA 10/PDX

GAMMA10/PDXにおけるThomson散乱系を用いた電子温度と密度の径方向分布測定
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Volume: 13  Page: 3402051(J-STAGE)  Publication year: 2018 
JST Material Number: U0045A  ISSN: 1880-6821  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Plasma diagnostics  ,  Fusion devices  ,  Plasma devices 
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