Art

J-GLOBAL ID：201902243341474115   Reference number：19A2515852

Mossbauer spectroscopic microscope study on diffusion and segregation of Fe impurities in mc-Si wafer

MC-Siウエハ中のFe不純物の拡散と偏析に関するMoessbauer分光顕微鏡研究【JST・京大機械翻訳】

Author (6)： Yoshida Yutaka (Shizuoka Institute of Science and Technology, Fukuroi, Japan) ,  Watanabe Tomio (Shizuoka Institute of Science and Technology, Fukuroi, Japan) ,  Ino Yuji (Shizuoka Institute of Science and Technology, Fukuroi, Japan) ,  Kobayashi Masashi (Shizuoka Institute of Science and Technology, Fukuroi, Japan) ,  Takahashi Isao (Graduate School of Engineering and School of Engineering, Nagoya University Furo-cho, Nagoya, Japan) ,  Usami Noritaka (Graduate School of Engineering and School of Engineering, Nagoya University Furo-cho, Nagoya, Japan)
Material： Hyperfine Interactions
Volume： 240  Issue： 1  Page： 1-8  Publication year： 2019 
JST Material Number： H0639A  ISSN： 0304-3843  CODEN： HYINDN  Document type： Article
Article type： 原著論文  Country of issue： Germany, Federal Republic of (DEU)  Language： ENGLISH (EN)

Abstract/Point： Fe diffusion and segregation p...

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Thesaurus term： interaction ,  *segregation(concentration distribution) ,  grain boundary ,  crystal grain ,  *iron ,  diffusion process ,  crystal ,  *Moessbauer spectroscopy ,  space resolving power ,  *silicon ,  residual stress ,  lattice defect ,  *impurity
Semi thesaurus term： 化学状態 , 【Automatic Indexing@JST】

Author keywords (4)： Mossbauer spectroscopic microscope ,  Imaging technique ,  Fe diffusion in mc-Si ,  Iron contamination in Si solar cells

JST classification (2)： Proteins and peptides in general  (EB03010N) ,  Molecular structure  (EB03020Y)

Terms in the title (9)： MC ,  Siウエハ ,  Fe ,  不純物 ,  拡散 ,  偏析 ,  分光 ,  顕微鏡 ,  研究