Art

J-GLOBAL ID：201902261681728698   Reference number：19A2331904

Characterization of binary Ce-Ir alloy photocathodes

二元Ce-Ir合金光電陰極の特性評価

Author (13)： SATOH Daisuke (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba, JPN) ,  SHIBUYA Tatsunori (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba, JPN) ,  OGAWA Hiroshi (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba, JPN) ,  OGAWA Hiroshi (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Chiba, JPN) ,  TANAKA Masahito (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba, JPN) ,  TANAKA Masahito (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Chiba, JPN) ,  IKEURA-SEKIGUCHI Hiromi (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba, JPN) ,  KURODA Ryunosuke (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba, JPN) ,  KURODA Ryunosuke (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Chiba, JPN) ,  YOSHIDA Mitsuhiro (KEK, Ibaraki, JPN) ,  SUGAWARA Hitoshi (Kobe Univ., Kobe, JPN) ,  TOYOKAWA Hiroyuki (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba, JPN) ,  TOYOKAWA Hiroyuki (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Chiba, JPN)
Material： Japanese Journal of Applied Physics  (JJAP)
Volume： 58  Issue： SI  Page： SIIB10.1-SIIB10.5  Publication year： Aug. 2019 
JST Material Number： G0520B  ISSN： 0021-4922  CODEN： JJAPB6  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： *cerium containing alloy ,  *iridium base alloy ,  *photoelectric cathode ,  arc melting ,  scanning electron microscope ,  energy dispersive X-ray spectrometry ,  X-ray diffraction ,  micro structure ,  phase constitution ,  quantum efficiency
Semi thesaurus term： arc melting ,  EDX analysis ,  XRD

JST classification (2)： Crystal structure of metals  (BK06000V) ,  Photoemission and photoelectrons  (BM09030D)

Reference (30)：

• Y. Muroya, M. Lin, T. Watanabe, G. Wu, T. Kobayashi, K. Yoshii, T. Ueda, M. Uesaka, and Y. Katsumura, Nucl. Instrum. Methods Phys. Res. A 489, 554 (2002).
• J. Yang, K. Kan, T. Kondoh, Y. Yoshida, K. Tanimura, and J. Urakawa, Nucl. Instrum. Methods Phys. Res. A 637, S24 (2011).
• J. Grodkowski, P. Neta, and J. F. Wishart, J. Phys. Chem. A 107, 9794 (2003).
• J. B. Hastings, F. M. Rudakov, D. H. Dowell, J. F. Schmerge, J. D. Cardoza, J. M. Castro, S. M. Gierman, H. Loos, and P. M. Weber, Appl. Phys. Lett. 89, 184109 (2006).
• R. P. Chatelain, V. R. Morrison, C. Godbout, and B. J. Siwick, Appl. Phys. Lett. 101, 081901 (2012).

Terms in the title (4)： Ce ,  Ir合金 ,  光電陰極 ,  特性評価