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J-GLOBAL ID：201902280133175819   Reference number：19A0801101

Development of Debye-ring measurement system using SOI pixel detector

SOI画素検出器を用いたDebyeリング計測システムの開発【JST・京大機械翻訳】

Author (5)： Mitsui S. (Venture Business Laboratory, Organization of Frontier Science and Innovation, Kanazawa University, Kakumamachi, Kanazawa, Ishikawa 920-1192, Japan) ,  Sasaki T. (Human Science, Human and Socio-Environmental Studies, Kanazawa University, Kakumamachi, Kanazawa, Ishikawa 920-1192, Japan) ,  Arai Y. (Institute of Particle and Nuclear Studies, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan) ,  Miyoshi T. (Institute of Particle and Nuclear Studies, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan) ,  Nishimura R. (School of High Energy Accelerator Science, The Graduate University for Advanced Studies, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan)
Material： Nuclear Instruments & Methods in Physics Research. Section A. Accelerators, Spectrometers, Detectors and Associated Equipment  (Nucl Instrum Methods Phys Res Sect A Accel Spectrometers Detect Assoc)
Volume： 924  Page： 441-447  Publication year： 2019 
JST Material Number： D0208B  ISSN： 0168-9002  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Abstract/Point： At current industrial sites fo...

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Thesaurus term： X-ray tube ,  *measurement system ,  residual stress ,  high speed ,  X ray diagnosis ,  hardness ,  X-ray ,  *pixel ,  metal product ,  *detector ,  high power output ,  evaluation board ,  material characteristics ,  image technology
Semi thesaurus term： 測定時間 ,  非接触 , 【Automatic Indexing@JST】

Author keywords (6)： Debye-ring measurement ,  X-ray residual stress measurement ,  SOI pixel detector ,  INTPIX4 ,  SEABAS2 ,  Cos α method

JST classification (1)： Cyclic accelerators  (BE02020X)

Terms in the title (5)： SOI ,  画素 ,  検出器 ,  計測システム ,  開発