Art
J-GLOBAL ID：201902280562122760   Reference number：19A1386680

A compact model of I -V characteristic degradation for organic thin film transistors

有機薄膜トランジスタのためのI-V特性劣化のコンパクトモデル【JST・京大機械翻訳】
Author (5)：
Saito Michiaki

About Saito Michiaki

(Graduate School of Informatics, Kyoto University, Yoshida-hon-machi, Sakyo, Kyoto, 606-8501, Japan)

About Graduate School of Informatics, Kyoto University, Yoshida-hon-machi, Sakyo, Kyoto, 606-8501, Japan

, 
Shintani Michihiro

About Shintani Michihiro

(Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama-cho, Ikoma, Nara, 630-0192, Japan)

About Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama-cho, Ikoma, Nara, 630-0192, Japan

, 
Kuribara Kazunori

About Kuribara Kazunori

(National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki, 305-8565, Japan)

About National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki, 305-8565, Japan

, 
Ogasahara Yasuhiro

About Ogasahara Yasuhiro

(National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki, 305-8565, Japan)

About National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki, 305-8565, Japan

, 
Sato Takashi

About Sato Takashi

(Graduate School of Informatics, Kyoto University, Yoshida-hon-machi, Sakyo, Kyoto, 606-8501, Japan)

About Graduate School of Informatics, Kyoto University, Yoshida-hon-machi, Sakyo, Kyoto, 606-8501, Japan


Material：
IEEE Conference Proceedings  (IEEE Conf Proc)

About IEEE Conference Proceedings


Volume： 2019  Issue： ICMTS  Page： 194-199  Publication year： 2019 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Abstract/Point：
Abstract/Point
Japanese summary of the article(about several hundred characters).
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The lifetime of organic thin f...
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Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
MOSFET

About MOSFET

, 
*silicon

About silicon

, 
carrier mobility

About carrier mobility

, 
threshold voltage

About threshold voltage


Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
ドレイン電流

About ドレイン電流

, 
*コンパクトモデル

About コンパクトモデル

, 
*性能劣化

About 性能劣化

, 
*有機薄膜トランジスタ

About 有機薄膜トランジスタ

, 【Automatic Indexing@JST】
JST classification (3)：
JST classification
Category name(code) classified by JST.
Transistors 
(NC03070N)

About Transistors

,  Speach processing 
(JE05000E)

About Speach processing

,  Graphic and image processing in general 
(JE04010I)

About Graphic and image processing in general

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
有機薄膜トランジスタ

About 有機薄膜トランジスタ

, 
I-V特性

About I-V特性

, 
コンパクトモデル

About コンパクトモデル


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