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J-GLOBAL ID：201902287360141713   Reference number：19A0098711

Synthesis of Iron-Fullerene Complexes by Scattering of C₆₀ Ions on Ferrocenyl-Undecanethiol SAM Surfaces

フェロセニル-ウンデカンチオールSAM表面上のC₆₀イオンの散乱による鉄-フラーレン錯体の合成

Author (6)： Motohashi Kenji (Department of Biomedical Engineering, Faculty of Science and Engineering, Toyo University) ,  Motohashi Kenji (Bio-Nano Electronics Research Centre, Toyo University) ,  Tachikawa Tomoki (Graduate School of Interdisciplinary New Science, Toyo University) ,  Uchida Takashi (Bio-Nano Electronics Research Centre, Toyo University) ,  Uchida Takashi (Graduate School of Interdisciplinary New Science, Toyo University) ,  Kawamura Kensei (Department of Biomedical Engineering, Faculty of Science and Engineering, Toyo University)
Material： e-Journal of Surface Science and Nanotechnology (Web)  (表面科学とナノテクノロジー)
Volume： 16  Page： 127-131(J-STAGE)  Publication year： 2018 
JST Material Number： U0016A  ISSN： 1348-0391  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： fullerene C60 ,  *iron complex ,  *thiol ,  *monomolecular layer ,  ion scattering ,  complex formation ,  cluster ion ,  mass spectrometry ,  *ferrocenes ,  Glass ,  charge isolation ,  TOF ,  elemental analysis ,  ion beam ,  ICP-MS analysis ,  wafer ,  silicon ,  low energy ion scattering ,  *self-assembled monolayer ,  Si wafer
Semi thesaurus term： *SAM(monolayer) ,  silicon substrate ,  self-assembled monolayer ,  low energy ion scattering ,  inductively coupled plasma mass spectrometry

Author keywords (4)： Fullerenes ,  Low energy ion scattering ,  Molecule-solid scattering and diffraction-inelastic ,  Clusters

JST classification (4)： Molecular compounds  (CE02000C) ,  Carbon and its compounds  (YB02060D) ,  Iron complex  (CE01091H) ,  Aliphatic thiols  (CF03120R)

Substance index (1)： 11-(1,3-Cyclopentadienyl)-1-undecanethiol

Reference (23)：

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Terms in the title (7)： SAM ,  C60 ,  イオン ,  散乱 ,  鉄 ,  フラーレン ,  錯体