Art

J-GLOBAL ID：202002213443447393   Reference number：20A1781655

Fine residual stress distribution measurement of steel materials by SOI pixel detector with synchrotron X-rays

シンクロトロンX線を用いたSOIピクセル検出器による鉄鋼材料の微細残留応力分布測定【JST・京大機械翻訳】

Author (7)： Nishimura Ryutaro (Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK-IMSS), Oho 1-1, Tsukuba, Ibaraki, 305-0801, Japan) ,  Kishimoto Shunji (Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK-IMSS), Oho 1-1, Tsukuba, Ibaraki, 305-0801, Japan) ,  Sasaki Toshihiko (Institute of Human and Social Sciences, Kanazawa University, Kakumamachi, Kanazawa, Ishikawa 920-1192, Japan) ,  Mitsui Shingo (Institute of Human and Social Sciences, Kanazawa University, Kakumamachi, Kanazawa, Ishikawa 920-1192, Japan) ,  Shinya Masayoshi (Graduate School of Natural Science and Technology, Kanazawa University, Kakumamachi, Kanazawa, Ishikawa 920-1192, Japan) ,  Arai Yasuo (Institute of Particle and Nuclear Studies, High Energy Accelerator Research Organization (KEK-IPNS), Oho 1-1, Tsukuba, Ibaraki, 305-0801, Japan) ,  Miyoshi Toshinobu (Institute of Particle and Nuclear Studies, High Energy Accelerator Research Organization (KEK-IPNS), Oho 1-1, Tsukuba, Ibaraki, 305-0801, Japan)
Material： Nuclear Instruments & Methods in Physics Research. Section A. Accelerators, Spectrometers, Detectors and Associated Equipment  (Nucl Instrum Methods Phys Res Sect A Accel Spectrometers Detect Assoc)
Volume： 978  Page： Null  Publication year： 2020 
JST Material Number： D0208B  ISSN： 0168-9002  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Abstract/Point： Residual stress is an importan...

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Thesaurus term： crystal structure ,  *residual stress ,  *synchrotron ,  synchrotron radiation ,  metallic material ,  *steel product ,  detector ,  two dimension ,  X-ray image ,  industrial product ,  measurement system ,  prototype ,  *pixel detector ,  monochromatic X-ray ,  action and behavior

Author keywords (6)： SOI ,  Pixel detector ,  Residual stress ,  X-ray imaging ,  Semiconductor detector ,  Synchrotron radiation

JST classification (1)： Experimental techniques for particle and nuclear physics in general  (BE01010F)

Terms in the title (8)： シンクロトロン ,  X線 ,  SOI ,  ピクセル検出器 ,  鉄鋼材料 ,  微細 ,  残留応力 ,  分布