Art

J-GLOBAL ID：202002230703009416   Reference number：20A1258296

XFEL coherent diffraction imaging for weakly scattering particles using heterodyne interference

ヘテロダイン干渉を用いた弱散乱粒子のためのXFELコヒーレント回折イメージング【JST・京大機械翻訳】

Author (22)： Huang Chi-Feng (Institute of Physics, Academia Sinica, Taipei 115, Taiwan) ,  Chang Wei-Hau (Institute of Physics, Academia Sinica, Taipei 115, Taiwan) ,  Lee Ting-Kuo (Institute of Physics, Academia Sinica, Taipei 115, Taiwan) ,  Joti Yasumasa (Japan Synchrotron Radiation Research Institute/Spring-8, Hyogo 679-5198, Japan) ,  Nishino Yoshinori (Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0021, Japan) ,  Kimura Takashi (Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0021, Japan) ,  Suzuki Akihiro (Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0021, Japan) ,  Bessho Yoshitaka (Institute of Physics, Academia Sinica, Taipei 115, Taiwan) ,  Lee Tsung-Tse (Institute of Physics, Academia Sinica, Taipei 115, Taiwan) ,  Chen Mei-Chun (Institute of Physics, Academia Sinica, Taipei 115, Taiwan) ,  Yang Shun-Min (Institute of Physics, Academia Sinica, Taipei 115, Taiwan) ,  Hwu Yeukuang (Institute of Physics, Academia Sinica, Taipei 115, Taiwan) ,  Huang Shih-Hsin (Institute of Chemistry, Academia Sinica, Taipei 115, Taiwan) ,  Li Po-Nan (Institute of Physics, Academia Sinica, Taipei 115, Taiwan) ,  Chen Peilin (Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan) ,  Tseng Yung-Chieh (Genomics Research Center, Academia Sinica, Taipei 115, Taiwan) ,  Ma Che (Genomics Research Center, Academia Sinica, Taipei 115, Taiwan) ,  Hsu Tsui-Ling (Genomics Research Center, Academia Sinica, Taipei 115, Taiwan) ,  Wong Chi-Huey (Genomics Research Center, Academia Sinica, Taipei 115, Taiwan) ,  Tono Kensuke (RIKEN SPring-8 Center, Hyogo 679-5148, Japan) ,  Ishikawa Tetsuya (RIKEN SPring-8 Center, Hyogo 679-5148, Japan) ,  Liang Keng S. (Institute of Physics, Academia Sinica, Taipei 115, Taiwan)
Material： AIP Advances (Web)
Volume： 10  Issue： 5  Page： 055219-055219-11  Publication year： 2020 
JST Material Number： U7121A  ISSN： 2158-3226  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： The spatial resolution of x-ra...

Register(free) or Log In to access     To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=20A1258296&from=J-GLOBAL&jstjournalNo=U7121A") }}

Thesaurus term： *diffraction ,  *interference ,  *coherence ,  *scattering ,  electron density ,  electric current ,  Computer Simulation ,  influenza virus ,  *image processing ,  pulse ,  picture enhancement ,  fluence ,  nano particle ,  *X-ray free electron laser ,  gold nanoparticle ,  computer application ,  utilization ,  microorganism

JST classification (2)： Other lasers  (BD04090H) ,  X-ray diffraction methods  (BK01020I)

Terms in the title (7)： ヘテロダイン ,  干渉 ,  散乱 ,  XFEL ,  コヒーレント ,  回折 ,  イメージング