Art

J-GLOBAL ID：202002231441711250   Reference number：20A0495638

Light-Illumination-Induced Degradation and Its Long-Term Recovery in Indium-Tin-Zinc Oxide Thin-Film Transistors

インジウム-スズ-亜鉛酸化物薄膜トランジスタにおける光照射誘起劣化とその長期回復【JST・京大機械翻訳】

Author (9)： Zhang Meng (Shenzhen University,Institute of Microscale Optoelectronics (IMO),Shenzhen,China,518060) ,  Ma Xiaotong (Shenzhen University,Institute of Microscale Optoelectronics (IMO),Shenzhen,China,518060) ,  Jiang Zhendong (Shenzhen University,Institute of Microscale Optoelectronics (IMO),Shenzhen,China,518060) ,  Deng Sunbin (The Hong Kong University of Science and Technology,State Key Laboratory of Advanced Displays and Optoelectronics Technologies,Kowloon,Hong Kong) ,  Li Guijun (Shenzhen University,Institute of Microscale Optoelectronics (IMO),Shenzhen,China,518060) ,  Chen Rongsheng (South China University of Technology,School of Electronic and Information Engineering,Guangzhou,China,510640) ,  Yan Yan (Shenzhen University,Institute of Microscale Optoelectronics (IMO),Shenzhen,China,518060) ,  Wong Man (The Hong Kong University of Science and Technology,State Key Laboratory of Advanced Displays and Optoelectronics Technologies,Kowloon,Hong Kong) ,  Kwok Hoi-Sing (The Hong Kong University of Science and Technology,State Key Laboratory of Advanced Displays and Optoelectronics Technologies,Kowloon,Hong Kong)
Material： IEEE Conference Proceedings  (IEEE Conf Proc)
Volume： 2019  Issue： IPFA  Page： 1-3  Publication year： 2019 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： Light-illumination-induced deg...

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Thesaurus term： lighting and illumination ,  *zinc oxide ,  *photoirradiation ,  *thin film transistor ,  simulation
Semi thesaurus term： 分解機構 ,  TCAD ,  サブ閾値 ,  閾値電圧シフト , 【Automatic Indexing@JST】

JST classification (1)： Graphic and image processing in general  (JE04010I)

Terms in the title (8)： インジウム ,  スズ ,  亜鉛酸化物 ,  薄膜トランジスタ ,  光照射 ,  誘起 ,  長期 ,  回復