Art

J-GLOBAL ID：202002242795455357   Reference number：20A2245510

X-ray in situ observation of graphene precipitating directly on sapphire substrate with and without Ti capping layer

Tiキャッピング層の有無でのサファイア基板に直接析出したグラフェンのX線その場観察【JST・京大機械翻訳】

Author (9)： Naritsuka Shigeya (Department of Materials Science and Engineering, Meijo University, Nagoya 468-8502, Japan) ,  Yamada Jumpei (Department of Materials Science and Engineering, Meijo University, Nagoya 468-8502, Japan) ,  Ueda Yuki (Department of Materials Science and Engineering, Meijo University, Nagoya 468-8502, Japan) ,  Nakashima Asato (Department of Materials Science and Engineering, Meijo University, Nagoya 468-8502, Japan) ,  Kashio Tatsuya (Department of Materials Science and Engineering, Meijo University, Nagoya 468-8502, Japan) ,  Maruyama Takahiro (Department of Applied Chemistry, Meijo University Nagoya 468-8502, Japan) ,  Fujikawa Seiji (National Institutes for Quantum and Radiological Science and Technology (QST), Hyogo 679-5148, Japan) ,  Sasaki Takuo (National Institutes for Quantum and Radiological Science and Technology (QST), Hyogo 679-5148, Japan) ,  Takahasi Masamitu (National Institutes for Quantum and Radiological Science and Technology (QST), Hyogo 679-5148, Japan)
Material： Journal of Crystal Growth  (J Cryst Growth)
Volume： 549  Page： Null  Publication year： 2020 
JST Material Number： B0942A  ISSN： 0022-0248  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Abstract/Point： In situ X-ray diffraction meas...

Register(free) or Log In to access     To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=20A2245510&from=J-GLOBAL&jstjournalNo=B0942A") }}

Thesaurus term： X-Ray Diffraction ,  interface (surface) ,  nucleation ,  crystallization ,  low temperature ,  Carbon ,  *Titanium ,  Nickel ,  precipitation (sedimentation) ,  *in situ observation ,  metal catalyst ,  *graphene ,  *sapphire substrate
Semi thesaurus term： *キャップ層 , 【Automatic Indexing@JST】

Author keywords (5)： Nanomaterials (B1) ,  Solid phase epitaxy (A3) ,  X-ray diffraction (A1) ,  Growth models (A1) ,  Low dimensional structures (A1)

JST classification (2)： Oxide thin films  (BK14050P) ,  Semiconductor thin films  (BK14040E)

Terms in the title (7)： Ti ,  キャッピング層 ,  サファイア基板 ,  析出 ,  グラフェン ,  X線 ,  その場観察