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J-GLOBAL ID：202002249697050393   Reference number：20A1439317

Feasibility study of TlBr semiconductor detectors for PIXE applications

PIXE応用のためのTlBr半導体検出器の実現可能性研究【JST・京大機械翻訳】

Author (7)： Nogami Mitsuhiro (Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan) ,  Hitomi Keitaro (Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan) ,  Onodera Toshiyuki (Department of Electrical and Electronic Engineerings, Tohoku Institute of Technology, Sendai 982-8577, Japan) ,  Matsumoto Kio (Department of Applied Energy Engineering, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan) ,  Watanabe Kenichi (Department of Applied Energy Engineering, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan) ,  Terakawa Atsuki (Cyclotron and Radioisotope Center, Tohoku University, Sendai 980-8578, Japan) ,  Ishii Keizo (Cyclotron and Radioisotope Center, Tohoku University, Sendai 980-8578, Japan)
Material： Nuclear Instruments & Methods in Physics Research. Section B. Beam Interactions with Materials and Atoms  (Nuclear Instruments and Methods in Physics Research. Section B. Beam Interactions with Materials and Atoms)
Volume： 477  Page： 43-45  Publication year： 2020 
JST Material Number： H0899A  ISSN： 0168-583X  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Abstract/Point： Semiconductor detectors for PI...

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Thesaurus term： photon ,  positive hole ,  *semiconductor detector ,  polarization (phenomenon) ,  Thallium ,  X-ray spectrometer ,  multiplex ,  pulse ,  detector ,  practical application test ,  semiconductor radiation detector ,  energy resolving power ,  FWHM ,  trapping
Semi thesaurus term： トラッピング , 【Automatic Indexing@JST】

Author keywords (4)： Thallium bromide ,  X-ray spectrometer ,  Particle-induced X-ray emission ,  Semiconductor radiation detector

JST classification (5)： Radiation detection and detectors  (AD08020J) ,  Interactions with X-rays  (BK16030H) ,  Dosimetry and instruments  (AD08050Q) ,  X-ray instruments and techniques  (BA02060D) ,  Microscopy determination of structures  (BK01040E)

Terms in the title (5)： PIXE ,  応用 ,  半導体検出器 ,  実現可能性 ,  研究