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J-GLOBAL ID：202002256673786199   Reference number：20A1753615

On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test

劣化検出のためのオンチップ遅延測定と加速寿命試験でのその評価【JST・京大機械翻訳】

Author (7)： Miyake Yousuke (Kyushu Institute of Technology 680-4 Kawazu, Iizuka,Fukuoka,Japan,820-8502) ,  Kato Takaaki (Kyushu Institute of Technology 680-4 Kawazu, Iizuka,Fukuoka,Japan,820-8502) ,  Kajihara Seiji (Kyushu Institute of Technology 680-4 Kawazu, Iizuka,Fukuoka,Japan,820-8502) ,  Aso Masao (PRIVATECH Inc. 2-7-10 Kuwamizu, Chuo-ku,Kumamoto,Japan,862-0954) ,  Futami Haruji (PRIVATECH Inc. 2-7-10 Kuwamizu, Chuo-ku,Kumamoto,Japan,862-0954) ,  Matsunaga Satoshi (PRIVATECH Inc. 2-7-10 Kuwamizu, Chuo-ku,Kumamoto,Japan,862-0954) ,  Miura Yukiya (Tokyo Metropolitan University 6-6 Asahigaoka, Hino,Tokyo,Japan,102-0076)
Material： IEEE Conference Proceedings  (IEEE Conf Proc)
Volume： 2020  Issue： IOLTS  Page： 1-6  Publication year： 2020 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： Periodical delay measurement i...

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Thesaurus term： simulation ,  failure ,  *clock ,  voltage fluctuation ,  resolving power ,  senile change ,  acceleration test ,  digital method ,  sensor ,  built-in self-test ,  complementary metal oxide semiconductor ,  voltage sensor ,  *time measuring instrument ,  test
Semi thesaurus term： *オンチップ ,  クロック発生器 ,  回路遅延 , 【Automatic Indexing@JST】

JST classification (1)： Graphic and image processing in general  (JE04010I)

Terms in the title (5)： 劣化検出 ,  オンチップ ,  遅延 ,  加速寿命試験 ,  評価