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J-GLOBAL ID：202002263742494758   Reference number：20A1884797

Spectroscopic ellipsometry of monolayered CdS nanoparticles assembled by layer-by-layer method

layer-by-layer法により集合した単層CdSナノ粒子の分光偏光解析法【JST・京大機械翻訳】

Author (4)： Shim YongGu (Department of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University, Gakuen-cho 1-1, Nakaku, Sakai, Osaka 599-8531, Japan) ,  Kitano Atsushi (Department of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University, Gakuen-cho 1-1, Nakaku, Sakai, Osaka 599-8531, Japan) ,  Wakita Kazuki (Department of Electrical, Electronics and Computer Engineering, Chiba Institute of Technology, 2-17-1 Tsudanuma, Narashino 275-0016, Japan) ,  Kim DaeGwi (Department of Applied Physics, Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan)
Material： Journal of Applied Physics  (Journal of General Physics and its Application to Other Sciences and to Industry)
Volume： 128  Issue： 7  Page： 075303-075303-7  Publication year： 2020 
JST Material Number： C0266A  ISSN： 0021-8979  CODEN： JAPIAU  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： Semiconductor nanoparticles (N...

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Thesaurus term： thin film ,  semiconductor ,  *cadmium sulfide ,  optical constant ,  dielectric function ,  monolayer ,  structural parameter ,  absolute value ,  number density ,  monolayer film ,  semiconductor nanoparticle ,  cadmium sulfide nanoparticle
Semi thesaurus term： *分光偏光解析法 , 【Automatic Indexing@JST】

JST classification (2)： Optical properties of condensed matter in general  (BM08010A) ,  Oxide thin films  (BK14050P)

Terms in the title (4)： 集合 ,  単層 ,  CdSナノ粒子 ,  分光偏光解析法